1. AABUS:?As Agreed Upon Between User
and Supplier
由供需双方协商确定
2. ASIC:?Applications Specific IC
专用集成电路
3. ASM:?Array Surface Mount
阵列表面贴装
4. ASMP:?Application Specific Module Packaging
专用模块封装
5. AXI:?Automatic X-Ray Inspection
自动X射线检查
6. BGA:?Ball Grid Array
球栅阵列
7. BOC:? Board-On-Chip
芯片上板子直装
8. BT:?Bismaleimide-Triazine
双马来酰亚胺三嗪
9. CAGE:?Commercial and Government Entity
商业及政府机构
10. CBGA:?Ceramic Ball Grid Array
陶瓷球栅阵列
11. CCGA:?Ceramic Column Grid Array
陶瓷柱栅阵列
12. CGA:?Column Grid Array
柱栅阵列
13. COB: Chip-On-Board
板上芯片直装
14. CPU:?Central Processing Unit
中央处理器
15. CSP:?Chip Scale Packages
芯片尺寸封装
16. CTE:?Coefficient of Thermal Expansion
热膨胀系数
17. CTF:?Critical To Function
关键功能
18. DBDPE:?Decabromodiphenyl Ether
十溴联苯醚
19.DDR-SDRAM:Double-Data-Rate Synchronous
Dynamic Random Access Memory
双倍速率同步动态随机存取存储器
20.Df:? Dissipation Factor
损耗因子
21.DfM: Design for Manufacturability
可制造性设计
22.DfR:? Design for Reliability
可靠性设计
23. DIG:? Direct Immersion Gold
直接浸金
24. Dk: Dielectric Constant
介电常数
25. DMA: Dynamic Mechanical Analysis
动态力学分析
26. DSBGA: Die-Size Ball Grid Array
芯片尺寸球栅阵列
27. DSC:? Differential Scanning Calorimetry
差分扫描热量测定法
28. DSP: Die Size Package
芯片尺寸封装
29. dT:? Temperature Differential
温差
30. ECM: Electrochemical Migration Test
电化学迁移测试
31. ENEPIG:? Electroless Nickel/Electroless
Palladium/Immersion Gold
化学镀镍/化学镀钯/浸金
32. ENIG:? Electroless Nickel Immersion Gold
化学镀镍浸金
33. ESD:? Electrostatic Discharge/
Electrostatic Device
静电放电/静电装置
34. ESS:Environmental Stress Screening
环境应力筛选
35. EU:? European Union
欧盟
36. FAT:? Flux Activation Time
助焊剂活化时间
37.?FBGA: Fine Pitch Ball Grid Array
密节距球栅阵列
38. FC:? Flip Chip
倒装芯片
39. FPT:? Fine Pitch Technology
密节距技术
40. FRBGA:? Fine-Pitch, Rectangular Ball Grid Array
密节距,矩形球栅阵列
41. FT:? Functional Test
功能测试
42. GAC: Grid Array Component
格栅阵列器件
43. HASL:? Hot Air Solder Level
热风焊料整平
44. HAST:? Highly Accelerated Stress Testing
高加速应力测试
45. HCI:? Hydrochloric
氯化氢的
46. HDB:? High Density Printed Boards
高密度印制板
47. HF:? Hydrofluoric
氢氟酸的
48. HoP: Head-on-Pillow
枕头效应
49. I/O:? Input/Output
输入/输出
50. ICT:? In-Circuit Test
在线测试
51. ILC:? Independent Loading Mechanism
独立加载机构
52. IMC:? Intermetallic Compound
金属间化合物
53. IR:? Infrared
红外线
54. LCP:? Liquid Crystal Polymer
液晶聚合物
55. LFBGA: Low-Profile Fine-Pitch Ball Grid Array
小外形密节距球栅阵列
56. LMC:? Least Material Condition
最小实体条件
57.?LTD: Liquidus Time Delay
液相时间延迟
58. MCM: Multichip Module
多芯片模块
59. MCM-L:? Multichip Module-Laminate
多芯片模块-层压板
60. MCP:? Multichip Package
多芯片封装
61. MD:? Metal Defined
金属限定
62. MDA:? Manufacturing Defect Analyzer
制造缺陷分析仪
63. MDS:? Multi Device Subassembly
多器件子组件
64. MLC:? Multilayer Ceramic
多层陶瓷
65. MMB:? Moisture Membrane Bag
湿薄膜袋
66. MMC:? Maximum Material Condition
最大实体条件
67. NAND:?Not “And”
非“与”
68.NSMD:??Nonsolder Mask Defined
非阻焊膜限定
69. OEM:? Original Equipment Manufacturer
原始设备制造商
70. OSP:? Organic Solderability Preservative
有机可焊性保护剂
71. PBB:? Polybrominated Biphenyl
多溴化联苯
72. PBBO:? Polybrominated Biphenyl Oxide
多溴化联苯氧化物
73. PBDE:? Polybrominated Diphenyl Ether
多溴二苯醚
74. PBGA: Plastic Ball Grid Array
塑封球栅阵列
75. PCA:? Printed Circuit Assembly
印制电路组件
76. PCB:? Printed Circuit Board
印制电路板
77.?PCM:? Phase Change Materials
相变材料
78. PCMCIA:? Personal Computer Memory Card
International Association
个人计算机存储卡国际协会
79. PGA:? Pin Grid Array
针栅阵列
80. PLCC:? Plastic Leaded Chip Carrier
塑料有引线芯片载体
81. PSA:? Pressure Sensitive Adhesives
压敏粘合剂
82. PTH:? Plated Through-Hole
镀通孔
83. QFP:? Quad Flat Pack
方形扁平封装
84. RDS:? Rectangular Die Size
矩形芯片尺寸
85. RF:? Radio Frequency
射频
86. RFID:? Radio Frequency Identification
射频识别
87. RMS:? Root Mean, Square
均方根
88. RoHS: Restriction of Hazardous Substances
有害物质限制
89. RSS:? Ramp-Soak-Spike
升温-保温-峰值
90. RTS:? Ramp-to-Spike
升温至峰值
91. SAC:? Sn/Ag/Cu
锡/银/铜
92. SDRAM:? Synchronous Dynamic Random
Access Memory
同步动态随机访问存储器
93. SGA:? Solder Grid Array
焊料栅格阵列
94. SIR:? Surface Insulation Resistance
表面绝缘电阻
95. SMD:? Solder Mask Defined
阻焊膜限定
96.?SMOBC: Solder Mask Over Bare Copper
裸铜覆阻焊膜
97. SMT:? Surface Mounting Technology
表面贴装技术
98. SO-DIMM:?Small Outline Dual In-Line
Memory Module
小外形双列直插存储模块
99. SOIC:? Small Outline Integrated Circuit
小外形集成电路
100. SPC:? Statistical Process Control
统计过程控制
101. SRAM:? Static Random Access Memory
静态随机存取存储器
102.?SSO:? Simultaneously Switching Output
同步开关输出
103. STII:? Soldering Temperature Impact Index
焊接温度影响指数
104. TAB:? Tape-Automated Bonding
载带自动键合
105. TAL:? Time Above Liquidus
液相线上时间
106. TBBPA:? Tetrabromobisphenol A
四溴双酚A
107. TBGA:? Tape Ball Grid Array
载带球栅阵列
108. Td:? Decomposition Temperature
分解温度
109. TFBGA:? Thin Profile Fine Pitch Ball Grid Array
薄外形细节距球栅阵列
110. Tg: Transition Temperature
转变温度
111. TIM:? Thermal Interface Materials
热界面材料
112. TMA:? Thermal Mechanical Analysis
热机械分析
113. UFPT:? Ultra Fine Pitch Technology
超密节距技术
114. UtRAM:? Uni-transistor Random Access Memory
单一晶体管随机存取存储器
115.?UUT:? Unit Under Test
被测单元
116. UV:? Ultraviolet
紫外线
117. VFBGA:? Very Thin-Profile Fine-Pitch Ball
Grid Array
极薄外形细节距球栅阵列
118. WEEE:? Waste in Electrical and Electronic
Equipment
废弃电子电器设备
119. ZIF:? Zero Insertion Force
零插拔力
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